• DocumentCode
    2795664
  • Title

    Improving the performance of protection schemes in three level IGCT-based neutral point clamped converters

  • Author

    Rocha, Anderson V. ; Franca, Gleisson J. ; Santos, Manoel E dos ; De Paula, Helder ; Filho, Braz J Cardoso

  • fYear
    2010
  • fDate
    12-16 Sept. 2010
  • Firstpage
    2326
  • Lastpage
    2332
  • Abstract
    High power IGCT-based converters are currently used in a wide range of drive applications. The protection of such converters against internal faults has been addressed in the technical literature, but the main focus has been on the solutions to disconnect the converter from the mains. In this paper, the short circuit current paths through the power devices in the three level NPC bridge are identified and studied from the perspective of keeping the overall repair cost, after a fault leading to the shoot-through mode, to a minimum. It is shown in this paper that a preferred short-circuit current path that limits the thermal energy in all IGCTs to safe levels exists. Furthermore, it is demonstrated that it is possible to guarantee, through proper busbar geometry and/or device selection, that the short-circuit current stress can always be moved to the power diodes. Simulation results are presented to support all the discussions and conclusions.
  • Keywords
    drives; power convertors; power system faults; power system protection; device selection; drive applications; internal faults; power devices; power diodes; proper busbar geometry; protection schemes; shoot-through mode; short circuit current paths; short-circuit current stress; thermal energy; three level IGCT-based neutral point clamped converters; three level NPC bridge; Circuit breakers; Circuit faults; Clamps; Converters; Current distribution; Rectifiers; Semiconductor diodes; IGCT; NPC converters; active rectifiers; protection; reliability; short-circuit currents;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-5286-6
  • Electronic_ISBN
    978-1-4244-5287-3
  • Type

    conf

  • DOI
    10.1109/ECCE.2010.5617875
  • Filename
    5617875