Title :
Reliability analysis of large fault trees using the Vesely failure rate
Author :
Amari, Suprasad V. ; Akers, Jennifer B.
Author_Institution :
Relex Software Corp., Greensburg, PA, USA
Abstract :
Fault trees provide a compact, graphical, intuitive method to analyze system reliability. However, combinatorial fault tree analysis methods, such as binary decision diagrams, cannot be used to find the reliability of systems with repairable components. In such cases, the analyst should use either Markov models explicitly or generate Markov models from fault trees using automatic conversion algorithms. This process is tedious and generates huge Markov models even for moderately sized fault trees. In this paper, the use of the Vesely failure rate as an approximation to the actual failure rate of the system to find the reliability-based measures of large fault trees is demonstrated. The main advantage of this method is that it calculates the reliability of a repairable system using combinatorial methods such as binary decision diagrams. The efficiency of this approximation is demonstrated by comparing it with several other approximations and provide various bounds for system reliability. The usefulness of this method in finding the other reliability measures such as MTBF, MTTR, MTTF, and MTTFF is shown. Finally, extending this method to analyze complex fault trees containing static and dynamic modules as well as events represented by other modeling tools.
Keywords :
Markov processes; binary decision diagrams; fault trees; MTBF; MTTF; MTTFF; MTTR; Markov models; Vesely failure rate; automatic conversion algorithms; binary decision diagrams; combinatorial methods; complex fault trees; dynamic modules; large fault trees; mean time between failures; mean time to failure; mean time to first failure; mean time to repair; modeling tools; repairable system; static modules; system reliability analysis; Algorithm design and analysis; Binary decision diagrams; Boolean functions; Data structures; Failure analysis; Fault trees; Frequency; Hazards; Reliability; Safety;
Conference_Titel :
Reliability and Maintainability, 2004 Annual Symposium - RAMS
Print_ISBN :
0-7803-8215-3
DOI :
10.1109/RAMS.2004.1285481