DocumentCode
2796135
Title
An educational environment for digital testing: hardware, tools, and Web-based runtime platform
Author
Jutman, A. ; Raik, J. ; Ubar, R. ; Vislogubov, V.
Author_Institution
Tallinn Univ. of Technol., Estonia
fYear
2005
fDate
30 Aug.-3 Sept. 2005
Firstpage
412
Lastpage
419
Abstract
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in Tallinn University of Technology and consists of several functional layers. The first one is the hardware component used for illustration of various physical phenomena appearing in defected circuits. In many cases such phenomena are hard to illustrate by software simulation or by any other means, which makes the usage of such a hardware component unavoidable. The second component is a set of university tools covering a large scope of topics in basics of testing, diagnosis, and BIST. The tools represent an efficient alternative to hard-to-learn and expensive commercial CAD systems. The wrapper to these two components is a cross-platform Web interface that represents a server-based solution for using all the available tools and the hardware over Internet. The whole platform is an extendable server-based low-cost solution, which is easy to set-up and use. The learning environment is complemented by laboratory work scenarios and teaching materials that also available in the Web.
Keywords
Internet; built-in self test; computer aided instruction; design for testability; distance learning; electronic engineering education; teaching; BIST; Internet; Web interface; Web-based runtime platform; commercial CAD system; design for testability; digital system testing; e-learning; educational environment; educational tool; hardware component; software simulation; teaching material; university tools; Built-in self-test; Circuit simulation; Circuit testing; Design for testability; Digital systems; Electronic learning; Hardware; Internet; Runtime environment; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on
Print_ISBN
0-7695-2433-8
Type
conf
DOI
10.1109/DSD.2005.15
Filename
1559834
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