• DocumentCode
    2796186
  • Title

    High field properties of polyether-ether-ketone

  • Author

    Ohishi, Kenji ; Hirai, Tomoo ; Tanaka, Yasuhiro ; Ohki, Yoshimichi

  • Author_Institution
    Dept. of Electr. Eng., Waseda Univ., Tokyo, Japan
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    1018
  • Abstract
    The mechanism of electrical conduction in PEEK (polyether-ether-ketone) was studied from the results of DC conduction and thermal pulse current (TPC) measurements. The DC conduction current in PEEK films was measured at various electric fields at room temperature. From the results of electric-field dependence, it is thought that the conduction mechanism in PEEK is due to hopping. The TPC spectra, which were obtained under short-circuit conditions after the application of various voltages, show the existence of heterospace charges near the two electrodes. The TPC spectra increase with an increase in the electric field applied. From these results, it is thought that the electrical conduction in PEEK is due to carrier hopping. The carriers reached near the counterelectrode are not easily neutralized and begin to form heterocharges
  • Keywords
    electrical conductivity of amorphous semiconductors and insulators; high field effects; hopping conduction; polymer films; thermally stimulated currents; DC conduction; PEEK films; TPC spectra; carrier hopping; electric-field dependence; electrical conduction; heterocharges; heterospace charges; high field properties; polyether-ether-ketone; short-circuit conditions; thermal pulse current; Chemicals; Conducting materials; Current measurement; Dielectrics and electrical insulation; Electric variables measurement; Electrical resistance measurement; Electrodes; Pulse measurements; Space charge; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172246
  • Filename
    172246