DocumentCode :
2796324
Title :
Breakdown mechanism of the charged solid dielectric during short circuit discharge
Author :
Baitun, Yang ; De, Liufu ; Demin, Tu ; Yaonan, Liu
Author_Institution :
Dept. of Electr. Eng., Xian Jiaotong Univ., China
fYear :
1991
fDate :
8-12 Jul 1991
Firstpage :
1048
Abstract :
The phenomenon of PET (polyethylene terephthalate) breakdown during short circuit discharge is studied. A theoretical model for detrapping by collisional ionization is proposed for interpretation of the breakdown mechanism. The coefficient for detrapping by collisional ionization and the relation between it and the velocity of the discharging are obtained. A critical electric field of the short circuit breakdown by space charges due to collisional ionization by detrapping is also suggested for solid dielectrics, and confirmed experimentally. The critical field is directly proportional to the thickness of the dielectric and inversely proportional to the detrapping coefficient of the collisional ionization, the time constant of the discharging circuit, and the dielectric constant
Keywords :
electric breakdown of solids; organic insulating materials; polymer films; PET; breakdown mechanism; charged solid dielectric; critical electric field; detrapping by collisional ionization; detrapping coefficient; dielectric constant; dielectric thickness; permittivity; polyethylene terephthalate; short circuit breakdown; short circuit discharge; space charges; theoretical model; time constant; Capacitors; Circuit testing; Dielectric breakdown; Electric breakdown; Electron traps; Ionization; Polymers; Solids; Space charge; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
Type :
conf
DOI :
10.1109/ICPADM.1991.172254
Filename :
172254
Link To Document :
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