• DocumentCode
    2796324
  • Title

    Breakdown mechanism of the charged solid dielectric during short circuit discharge

  • Author

    Baitun, Yang ; De, Liufu ; Demin, Tu ; Yaonan, Liu

  • Author_Institution
    Dept. of Electr. Eng., Xian Jiaotong Univ., China
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    1048
  • Abstract
    The phenomenon of PET (polyethylene terephthalate) breakdown during short circuit discharge is studied. A theoretical model for detrapping by collisional ionization is proposed for interpretation of the breakdown mechanism. The coefficient for detrapping by collisional ionization and the relation between it and the velocity of the discharging are obtained. A critical electric field of the short circuit breakdown by space charges due to collisional ionization by detrapping is also suggested for solid dielectrics, and confirmed experimentally. The critical field is directly proportional to the thickness of the dielectric and inversely proportional to the detrapping coefficient of the collisional ionization, the time constant of the discharging circuit, and the dielectric constant
  • Keywords
    electric breakdown of solids; organic insulating materials; polymer films; PET; breakdown mechanism; charged solid dielectric; critical electric field; detrapping by collisional ionization; detrapping coefficient; dielectric constant; dielectric thickness; permittivity; polyethylene terephthalate; short circuit breakdown; short circuit discharge; space charges; theoretical model; time constant; Capacitors; Circuit testing; Dielectric breakdown; Electric breakdown; Electron traps; Ionization; Polymers; Solids; Space charge; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172254
  • Filename
    172254