• DocumentCode
    2796393
  • Title

    Temperature dependence of tan δ in polyethylene

  • Author

    Tanimoto, Gen ; Okashita, Minoru ; Aida, Fumio ; Fujiwara, Yasutaka

  • Author_Institution
    Showa Electric Wire & Cable Co. Ltd., Kanagawa, Japan
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    1068
  • Abstract
    The authors measured the temperature characteristics of tan δ in commercial grade low-density polyethylene (LDPE) and very low-density PE produced by the high pressure polymerization process of linear low-density PE (LLDPE) and high-density PE (HDPE) produced by the low pressure production process, and of medium-density PE (MDPE) produced by the medium pressure production process. The measurement revealed that values of tan δ at high temperature were different according to the kind of PE. It is suggested that the temperature dependence of tan δ in PE can be changed by such factors influencing the conductivity of PE as ionic carriers and trapped electrons. DC leakage-current-temperature characteristics of these types of PE were measured in order to examine the effect of impurities contained in these samples. The relation between tan δ characteristics and the impurities derived from the production processes is discussed
  • Keywords
    dielectric loss measurement; organic insulating materials; polymers; DC leakage current; HDPE; LDPE; LLDPE; MDPE; conductivity; effect of impurities; high pressure polymerization process; high-density PE; ionic carriers; linear low-density PE; low pressure production process; medium pressure production process; medium-density PE; polyethylene; tan delta; temperature characteristics; temperature dependence; trapped electrons; very low-density PE; Current measurement; Dielectric losses; Electron beams; Impurities; Polyethylene; Polymers; Production; Stress; Temperature dependence; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172259
  • Filename
    172259