Author :
Keiner, William L. ; Coppola, Anthony ; Drummond, Robert R.
Keywords :
testability, automatic testing, BIT, testability standards, testability measures, design for testability, VHSIC, artificial intelligence, CAD, integrated diagnostics; Automatic testing; Built-in self-test; Circuit testing; Design for testability; Electronic equipment testing; Military standards; Research and development; System testing; Very high speed integrated circuits; Weapons;
