Title :
Depolarization of linearly polarized EM waves backscattered from rough metals and inhomogeneous dielectrics
Author :
Renau, J. ; Cheo, P.K. ; Cooper, H.G.
Author_Institution :
Bell Telephone Laboratories, Inc., Whippany, NJ, USA
Keywords :
Dielectric measurements; Helium; Laboratories; Particle scattering; Polarization; Rough surfaces; Surface emitting lasers; Surface roughness; Telephony;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1966
DOI :
10.1109/APS.1966.1150349
