DocumentCode :
2796542
Title :
Limitations to peak continuous wave power in high power broad area single emitter 980 nm diode lasers
Author :
Crump, P. ; Roder, C. ; Staske, R. ; Pietrzak, A. ; Pittroff, W. ; Ginolas, A. ; Fricke, J. ; Paschke, K. ; Bugge, F. ; Ressel, P. ; Wenzel, H. ; Erbert, G.
Author_Institution :
Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin, Germany
fYear :
2009
fDate :
14-19 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
Micro-channel cooling of 975nm single emitter broad area lasers has largely eliminated current heating as a power limitation. Instead, the peak achievable power is limited by high-current driven minority carrier accumulation in the waveguide. In order to enable higher powers, the copper carrier was replaced with a water-cooled microchannel heatsink. In previous studies of broad area lasers under short-pulse condition, rollover was also observed, even in the absence of current heating. This was found to correlate with minority carrier accumulation in the waveguide layer. Such accumulation can be observed experimentally via studies of the spontaneous emission. Carriers in the waveguide recombine and emit light in all directions - such emission can be separated spatially from stimulated (lasing) emission by measurements at a wide angle. In these devices, we also observe such carrier accumulation in the waveguide layers and such accumulation may be due to fundamental phonon-loss mechanisms.
Keywords :
heat sinks; laser beams; minority carriers; optical waveguides; semiconductor lasers; spontaneous emission; stimulated emission; continuous wave power; diode laser; high power broad area single emitter laser; high-current driven minority carrier accumulation; microchannel cooling; minority carrier accumulation; phonon-loss mechanism; spontaneous emission; stimulated emission; water-cooled microchannel heatsink; waveguide layer; wavelength 975 nm; wavelength 980 nm; Copper; Diode lasers; Microchannel; Optical waveguides; Power lasers; Power system reliability; Temperature sensors; Thermal resistance; Waveguide lasers; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
Type :
conf
DOI :
10.1109/CLEOE-EQEC.2009.5192642
Filename :
5192642
Link To Document :
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