DocumentCode
2796598
Title
Exploring cyber physical data streams using Radial Pixel Visualizations
Author
Hao, Miao ; Marwah, M. ; Mittelstadt, S. ; Janetzko, Halldor ; Keim, Daniel ; Dayal, U. ; Bash, Cullen ; Felix, Corinne ; Patel, Chirag ; Hsu, Meng-Kai ; Chen, Yuanfeng
Author_Institution
Hewlett-Packard Labs., Palo Alto, CA, USA
fYear
2012
fDate
14-19 Oct. 2012
Firstpage
225
Lastpage
226
Abstract
Cyber physical systems (CPS), such as smart buildings and data centers, are richly instrumented systems composed of tightly coupled computational and physical elements that generate large amounts of data. To explore CPS data and obtain actionable insights, we construct a Radial Pixel Visualization (RPV) system, which uses multiple concentric rings to show the data in a compact circular layout of small polygons (pixel cells), each of which represents an individual data value. RPV provides an effective visual representation of locality and periodicity of the high volume, multivariate data streams, and seamlessly combines them with the results of an automated analysis. In the outermost ring the results of correlation analysis and peak point detection are highlighted. Our explorations demonstrates how RPV can help administrators to identify periodic thermal hot spots, understand data center energy consumption, and optimize IT workload.
Keywords
computer centres; correlation methods; cybernetics; data visualisation; CPS data; RPV; automated analysis; correlation analysis; cyber physical data streams; cyber physical system; data center energy consumption; data value; multivariate data stream visual representation; peak point detection; periodic thermal hot spots; radial pixel visualizations; richly instrumented systems; smart buildings; Buildings; Correlation; Data visualization; Energy consumption; Servers; Temperature measurement; Temperature sensors; Radial pixel visualization; correlations; cyber physical system; peaks; time-series data;
fLanguage
English
Publisher
ieee
Conference_Titel
Visual Analytics Science and Technology (VAST), 2012 IEEE Conference on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4673-4752-5
Type
conf
DOI
10.1109/VAST.2012.6400541
Filename
6400541
Link To Document