DocumentCode
2796642
Title
Choosing a Practical MTTF Model for ECC Memory Chip
Author
Koo, D.Y. ; Chenoweth, H.B.
Author_Institution
Westinghouse Electric Corporation, Baltimore
fYear
1984
fDate
1984
Firstpage
255
Lastpage
261
Keywords
Circuits; Data analysis; Educational institutions; Error correction; Error correction codes; Failure analysis; Predictive models; Redundancy; Reliability engineering; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type
conf
DOI
10.1109/RAMS.1984.764301
Filename
764301
Link To Document