DocumentCode
2796739
Title
Integration of BIT Effectiveness with FMECA
Author
Collett, Ronald E. ; Bachant, Peter W.
Author_Institution
Electronic Test, Boston
fYear
1984
fDate
1984
Firstpage
300
Lastpage
305
Keywords
Circuit testing; Electronic equipment testing; Failure analysis; Information analysis; Measurement standards; Military standards; Performance analysis; Personnel; System testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type
conf
DOI
10.1109/RAMS.1984.764308
Filename
764308
Link To Document