Title :
Built-In-Test Self-Verification
Author :
Ramirez, Miguel A.
Author_Institution :
Westinghouse Electric Corporation, Baltimore
Keywords :
Automatic testing; Circuit testing; Condition monitoring; Electrical fault detection; Hardware; Logic; Power generation; Radio frequency; Signal design; Transmitters;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764310
