• DocumentCode
    2796765
  • Title

    Built-In-Test Self-Verification

  • Author

    Ramirez, Miguel A.

  • Author_Institution
    Westinghouse Electric Corporation, Baltimore
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    312
  • Lastpage
    314
  • Keywords
    Automatic testing; Circuit testing; Condition monitoring; Electrical fault detection; Hardware; Logic; Power generation; Radio frequency; Signal design; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1984. Proceedings. Annual
  • Type

    conf

  • DOI
    10.1109/RAMS.1984.764310
  • Filename
    764310