• DocumentCode
    2796811
  • Title

    Investigations on electro-thermal ageing of metal oxide surge arrester elements: a realistic laboratory simulation

  • Author

    Vipin, P.M. ; Nagabhushana, G.R. ; Jayaram, B.N.

  • Author_Institution
    Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    1152
  • Abstract
    The ageing of metal oxide surge arresters (MOSAs) under field operating conditions caused by a combination of electrical and thermal stresses is simulated in the laboratory in an attempt to characterize the degradation phenomena as well as to identify the significant indices of such a degradation. Other than the widely adopted leakage current index, the prospects of parameters such as barrier height, capacitance, tan delta, nonlinearity coefficient, and area ratio as sensitive degradation indices are studied. Also, the effect of electro-thermal aging on the V-I characteristics as a whole, up to the breakdown voltage of the MOSA, is presented. The simulation is carried out on a `one day=one year´ (of the arrester´s field life) basis. The accelerated aging for this purpose followed an empirical transient electrical stress pattern, while the IEC guidelines were followed for selection of continuous operating voltage of the arrester and the scheme of thermal stresses
  • Keywords
    ageing; life testing; surge protection; thermal stresses; IEC guidelines; MOSA; V-I characteristics; accelerated aging; area ratio; barrier height; capacitance; continuous operating voltage; degradation phenomena; electrical stresses; electro-thermal ageing; field operating conditions; laboratory simulation; leakage current; metal oxide surge arrester elements; nonlinearity coefficient; tan delta; thermal stresses; Accelerated aging; Arresters; Capacitance; Guidelines; IEC; Laboratories; Leakage current; Surges; Thermal degradation; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172281
  • Filename
    172281