DocumentCode :
2797008
Title :
2-D alignment analysis of capacitively coupled contactless power transfer systems
Author :
Liu, Chao ; Hu, Aiguo Patrick ; Nair, Nirmal-Kumar C. ; Covic, Grant A.
Author_Institution :
Sci. Centre, Univ. of Auckland, Auckland, New Zealand
fYear :
2010
fDate :
12-16 Sept. 2010
Firstpage :
652
Lastpage :
657
Abstract :
Capacitive Power Transfer (CPT) technology has been proposed and investigated recently as an alternative contactless power transfer solution which has the advantages of being able to transfer power across metal barriers and having low standing power losses. Alignment between the primary and secondary plates is one of the most important factors affecting the performance of a CPT system because any misalignment may cause a significant drop in the output power. This paper analyses the effect of the coupling variation caused by misalignments of the coupling plates and suggests improvement methods for achieving better tolerance. A simple circuit model is established and the system voltage transfer function is derived to investigate the 2-D alignments. It has been found that placing the tuning inductor on the primary side of the circuit can greatly improve the misalignment tolerance between the primary and secondary plates and even increase the system output voltage. The theoretical analysis has been verified by simulation and experimental results.
Keywords :
inductive power transmission; power convertors; power supplies to apparatus; 2-D alignment analysis; CPT system; capacitively coupled contactless power transfer system; circuit model; coupling variation; low standing power losses; metal barriers; primary plates; secondary plates; tuning inductor; voltage transfer function; Capacitors; Couplings; Electric fields; Inductors; Integrated circuit modeling; Transfer functions; Tuning; 2-D alignment; Capacitive Power Transfer (CPT); misalignment tolerance; tuning inductor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-5286-6
Electronic_ISBN :
978-1-4244-5287-3
Type :
conf
DOI :
10.1109/ECCE.2010.5617949
Filename :
5617949
Link To Document :
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