DocumentCode
2797016
Title
Designing Built-In Test for Microprocessors
Author
Smoot, Sterling
Author_Institution
Baltimore
fYear
1984
fDate
1984
Firstpage
412
Lastpage
415
Keywords
Built-in self-test; Central Processing Unit; Circuit testing; Hardware; Microprocessors; Microprogramming; Performance evaluation; Read only memory; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type
conf
DOI
10.1109/RAMS.1984.764327
Filename
764327
Link To Document