• DocumentCode
    2797212
  • Title

    Static-based verification of memory BIST integration

  • Author

    Lee, Kab Joo J ; Kim, Seunghan ; Park, Shihyeon ; Yoo, Youngdoo

  • Author_Institution
    ASIC Div., Samsung Electron. Co. Ltd., Kyungki-Do, South Korea
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    151
  • Lastpage
    154
  • Abstract
    Static-based verification methodologies are employed to minimize iterative simulations due to functional and timing problems after BIST integration into an ASIC. Formal equivalence checking is used to verify if BIST signals are correctly integrated into an ASIC. Static Timing Analysis (STA) is used to verify BIST timing. Two ASICs, implemented using 0.25 μm technology, are used to apply static-based verification methodologies. Our experimental results show that static-based verification achieves significant verification speedup compared to simulation. This allows fast and early detection of function and timing errors that may be introduced during BIST integration:
  • Keywords
    application specific integrated circuits; built-in self test; integrated circuit testing; iterative methods; logic testing; timing; 0.25 micron; ASIC; formal equivalence checking; iterative simulations; memory BIST integration; static timing analysis; static-based verification methodologies; timing errors; timing problems; verification speedup; Application specific integrated circuits; Automatic control; Built-in self-test; Controllability; Design optimization; Iterative methods; Large scale integration; Logic design; Logic testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
  • Conference_Location
    Cheju
  • Print_ISBN
    0-7803-6470-8
  • Type

    conf

  • DOI
    10.1109/APASIC.2000.896931
  • Filename
    896931