DocumentCode
2797212
Title
Static-based verification of memory BIST integration
Author
Lee, Kab Joo J ; Kim, Seunghan ; Park, Shihyeon ; Yoo, Youngdoo
Author_Institution
ASIC Div., Samsung Electron. Co. Ltd., Kyungki-Do, South Korea
fYear
2000
fDate
2000
Firstpage
151
Lastpage
154
Abstract
Static-based verification methodologies are employed to minimize iterative simulations due to functional and timing problems after BIST integration into an ASIC. Formal equivalence checking is used to verify if BIST signals are correctly integrated into an ASIC. Static Timing Analysis (STA) is used to verify BIST timing. Two ASICs, implemented using 0.25 μm technology, are used to apply static-based verification methodologies. Our experimental results show that static-based verification achieves significant verification speedup compared to simulation. This allows fast and early detection of function and timing errors that may be introduced during BIST integration:
Keywords
application specific integrated circuits; built-in self test; integrated circuit testing; iterative methods; logic testing; timing; 0.25 micron; ASIC; formal equivalence checking; iterative simulations; memory BIST integration; static timing analysis; static-based verification methodologies; timing errors; timing problems; verification speedup; Application specific integrated circuits; Automatic control; Built-in self-test; Controllability; Design optimization; Iterative methods; Large scale integration; Logic design; Logic testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
Conference_Location
Cheju
Print_ISBN
0-7803-6470-8
Type
conf
DOI
10.1109/APASIC.2000.896931
Filename
896931
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