DocumentCode
2797278
Title
Microprocessing to Reduce MTTR of Analog Systems
Author
Krause, George S., Jr.
Author_Institution
Westinghouse Electric Corporation, Baltimore
fYear
1984
fDate
1984
Firstpage
505
Lastpage
509
Keywords
Circuit faults; Circuit testing; Condition monitoring; Electrical fault detection; Fault detection; Manuals; Microprocessors; Performance evaluation; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type
conf
DOI
10.1109/RAMS.1984.764343
Filename
764343
Link To Document