Title :
Microprocessing to Reduce MTTR of Analog Systems
Author :
Krause, George S., Jr.
Author_Institution :
Westinghouse Electric Corporation, Baltimore
Keywords :
Circuit faults; Circuit testing; Condition monitoring; Electrical fault detection; Fault detection; Manuals; Microprocessors; Performance evaluation; System testing; Test equipment;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764343
