مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2797347

Title :

Quality, Reliability and Stress Testing

Author :

Evans, Jerry E.

Author_Institution :

IBM, East Fishkill

fYear :

1984

fDate :

1984

Firstpage :

525

Lastpage :

529

Keywords :

Acceleration; Circuit testing; Integrated circuit reliability; Integrated circuit testing; Life estimation; Reliability engineering; Semiconductor device reliability; Stress; Temperature; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Reliability and Maintainability Symposium, 1984. Proceedings. Annual

Type :

conf

DOI :

10.1109/RAMS.1984.764347

Filename :

764347

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2797347