DocumentCode
2797421
Title
Economic tradeoffs of in-circuit and functional testing
Author
Mrowiec, Terry
fYear
1978
fDate
1978
Firstpage
128
Lastpage
133
Keywords
Automatic testing; Circuit testing; Costs; Electronic equipment testing; Electronics industry; Environmental economics; Large scale integration; Production; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '78. International Automatic Testing Conference
Type
conf
DOI
10.1109/AUTEST.1978.764353
Filename
764353
Link To Document