DocumentCode
279757
Title
Physical modelling of GaAs photodiodes
Author
Barry, D.M. ; Snowden, C.M. ; Howes, M.J.
fYear
1990
fDate
32916
Firstpage
42370
Lastpage
42376
Abstract
The bipolar drift-diffusion model of an ITO/GaAs Schottky photodiode has been used to demonstrate the importance of photogenerated charge build up within the photodiode when used in detecting high bit rate digital signals. This causes an asymmetrical response affecting the detected high and low levels which become dependent on the digital pulse pattern. Optical illumination at wavelengths ⩽880 nm is through the ITO which is transparent to these frequencies. These devices have been fabricated where the depth of the intrinsic n - layer ranges from 10 μm to 0.45 μm with the smallest having a reported bandwidth of 110 GHz
fLanguage
English
Publisher
iet
Conference_Titel
Modelling of Optoelectronic Devices, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
189791
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