• DocumentCode
    279757
  • Title

    Physical modelling of GaAs photodiodes

  • Author

    Barry, D.M. ; Snowden, C.M. ; Howes, M.J.

  • fYear
    1990
  • fDate
    32916
  • Firstpage
    42370
  • Lastpage
    42376
  • Abstract
    The bipolar drift-diffusion model of an ITO/GaAs Schottky photodiode has been used to demonstrate the importance of photogenerated charge build up within the photodiode when used in detecting high bit rate digital signals. This causes an asymmetrical response affecting the detected high and low levels which become dependent on the digital pulse pattern. Optical illumination at wavelengths ⩽880 nm is through the ITO which is transparent to these frequencies. These devices have been fabricated where the depth of the intrinsic n- layer ranges from 10 μm to 0.45 μm with the smallest having a reported bandwidth of 110 GHz
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Modelling of Optoelectronic Devices, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    189791