Title :
Linear search algorithm for repair analysis with 4 spare row/4 spare column
Author :
Kwon, Hyeokman ; Moon, Joohyeong ; Byun, Jinsoo ; Park, Sangwook ; Chung, Jinyong
Author_Institution :
Hyundai Electron. Ind. Co. Ltd., Ichon, South Korea
Abstract :
An intelligent method of repair analysis that can repair a RAM block with 4 spare rows and 4 spare columns is implemented with CAM that has the function of datamatch, count-sub-entry, search-empty-entry. The key idea of this algorithm is on-the-fly repair analysis by rearrangement of the CAM array contents and repair analysis processing by one row or one column unit with a dual error buffer
Keywords :
content-addressable storage; design for testability; integrated circuit reliability; integrated memory circuits; memory architecture; random-access storage; redundancy; CAM; CAM array contents; RAM block repair; count-sub-entry; datamatch; dual error buffer; failure bitmap; intelligent method; linear search algorithm; repair analysis; search-empty-entry; Algorithm design and analysis; Built-in self-test; CADCAM; Computer aided manufacturing; Costs; Logic; Random access memory; Read-write memory; Redundancy; Testing;
Conference_Titel :
ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
Conference_Location :
Cheju
Print_ISBN :
0-7803-6470-8
DOI :
10.1109/APASIC.2000.896960
