DocumentCode :
2797622
Title :
High field electron transport and breakdown in amorphous and disordered solids
Author :
Inuishi, Yoshio
Author_Institution :
Osaka Univ., Japan
fYear :
1991
fDate :
8-12 Jul 1991
Firstpage :
66
Abstract :
Experimental results on high electric field electron transport and breakdown in amorphous or disordered solids are presented. It was found that the time-of-flight electron drift mobility in hydrogenated amorphous silicon (a-Si:H) films increased with increasing applied field. It was also found that the breakdown field in a-Si:H films and γ-ray irradiated KCl crystals had a negative temperature gradient in contrast to that in crystalline solids. These experimental results are consistently explained by taking account of the increase in electron temperature (hot electron) in the theory of dispersive transport in amorphous solids
Keywords :
F-centres; amorphous semiconductors; carrier mobility; electric breakdown of solids; elemental semiconductors; gamma-ray effects; high field effects; hot carriers; hydrogen; potassium compounds; silicon; F-centre formation; KCl crystals; amorphous Si:H; amorphous solids; breakdown; disordered solids; dispersive transport; electron temperature; gamma irradiation; high electric field electron transport; hot electron; negative temperature gradient; time-of-flight electron drift mobility; Amorphous materials; Amorphous silicon; Crystallization; Dispersion; Electric breakdown; Electron mobility; Kirchhoff´s Law; Semiconductor films; Solids; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
Type :
conf
DOI :
10.1109/ICPADM.1991.172356
Filename :
172356
Link To Document :
بازگشت