Title :
Efficient random vector verification method for an embedded 32-bit RISC core
Author :
Lee, Chang-Ho ; Yang, Hoon-Mo ; Kwak, Sung-Ho ; Lee, Moon-Key ; Park, Sanghyun ; Cho, Sangyeun ; Kim, Sangwoo ; Kim, Yongchun ; Jeong, Seh-Woong ; Chung, Bong-Young ; Roh, Hyung-Lae
Author_Institution :
Dept. of Electr. & Comput. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
Processors require both intensive and extensive functional verification in their design phase to satisfy their general purposability. The proposed random vector verification method for CalmRISCTM-32 core meets this goal by contributing complementary assistance for conventional verification methods. It adopts a cycle-accurate instruction level simulator as a reference model, runs simulation in both the reference and the target HDL and reports errors if any difference is found between them. These processes are automatically performed in the unified environment. The instruction level simulator, the core part in the verification environment is able to simulate almost every aspect of RISC processors from functional behavior of each opcode to timing details in the pipeline flow in fast speed. Its design style from microprogramming scheme also makes its structure modular and flexible
Keywords :
formal verification; instruction sets; integrated circuit design; microprocessor chips; parallel architectures; pipeline processing; reduced instruction set computing; timing; 32 bit; CalmRISC-32; cycle-accurate instruction level simulator; design phase; embedded RISC core; functional verification; instruction level simulator; microprogramming scheme; pipeline flow; random vector verification method; reference model; timing details; unified environment; Clocks; Delay; Design engineering; Embedded computing; Hardware design languages; Large scale integration; Pipelines; Reduced instruction set computing; Registers; Timing;
Conference_Titel :
ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
Conference_Location :
Cheju
Print_ISBN :
0-7803-6470-8
DOI :
10.1109/APASIC.2000.896965