Title :
Self-learning machines applied to the testing of semiconductor memories
Author_Institution :
University of Minnesota at Minneapolis
Keywords :
Artificial intelligence; Automatic testing; Circuit testing; Counting circuits; Large scale integration; Random access memory; Random number generation; Read-write memory; Semiconductor device testing; Sorting;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764374
