• DocumentCode
    2797754
  • Title

    Self-learning machines applied to the testing of semiconductor memories

  • Author

    Tuszynski, A.

  • Author_Institution
    University of Minnesota at Minneapolis
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    246
  • Lastpage
    250
  • Keywords
    Artificial intelligence; Automatic testing; Circuit testing; Counting circuits; Large scale integration; Random access memory; Random number generation; Read-write memory; Semiconductor device testing; Sorting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764374
  • Filename
    764374
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2797754