Title :
Design-to-cost: the road to testability
Author :
Dankworth, Theodore ; Risin, Murray
Author_Institution :
ManTech of New Jersey Corporation
Keywords :
Automatic testing; Costs; Design for testability; Electronic equipment testing; Fault detection; Hardware; Logic testing; Military aircraft; System testing; Weapons;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764389
