DocumentCode
2798576
Title
p-NiO/ITO transparent heterojunction — Preparation and characterization
Author
Forin, C.C. ; Purica, Munizer ; Budianu, Elena ; Schiopu, Paul
Volume
1
fYear
2012
fDate
15-17 Oct. 2012
Firstpage
131
Lastpage
134
Abstract
The paper presents the preparation of a transparent heterojunction on glass substrate consisting of p type NiO and n type ITO transparent oxidic semiconductors. NiO layer as a p type semiconductor and transparent layer was obtained by thermal oxidation at 430 oC of 50 nm metallic Ni films deposited by DC sputtering. Spectrophotometrical measurements used to investigate optical properties revealed a transmittance higher than 70% for NiO and 90% for ITO in the spectral range of 300-900 nm. The obtained p-NiO/n-ITO heterojunction exposed to ultraviolet radiation (λ ~ 240 nm) shows a good sensibility due to wide band gap of the layers.
Keywords
indium compounds; infrared spectra; nickel compounds; oxidation; p-n heterojunctions; rectification; semiconductor growth; semiconductor thin films; sputter deposition; transparency; ultraviolet radiation effects; ultraviolet spectra; visible spectra; wide band gap semiconductors; DC sputtering deposition; NiO-ITO; SiO2; glass substrate; infrared spectra; metallic nickel films; optical properties; p-n type transparent oxidic semiconductors; rectification; size 50 nm; spectrophotometrical measurements; temperature 430 degC; thermal oxidation; transmittance; transparent heterojunction; ultraviolet radiation; ultraviolet-visible spectra; wavelength 240 nm; wavelength 300 nm to 900 nm; wide band gap semiconductor; Heterojunctions; Indium tin oxide; Nickel; Optical films; Oxidation; Substrates; Transparent heterojunction; p type NiO; thermal oxidation;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference (CAS), 2012 International
Conference_Location
Sinaia
ISSN
1545-857X
Print_ISBN
978-1-4673-0737-6
Type
conf
DOI
10.1109/SMICND.2012.6400676
Filename
6400676
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