DocumentCode :
2798864
Title :
Carrier lifetime and linewidth enhancement factor measurements from cross-modulation characteristics in semiconductor optical amplifiers
Author :
Kikuchi, K. ; Itatani, T. ; Zah, C.E. ; Lee, T.P.
Author_Institution :
University of Tokyo
fYear :
1990
fDate :
9-14 Sept. 1990
Firstpage :
130
Lastpage :
131
Keywords :
Charge carrier density; Charge carrier lifetime; Frequency measurement; Frequency modulation; Optical interferometry; Optical modulation; Probes; Semiconductor lasers; Semiconductor optical amplifiers; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Laser Conference, 1990. Conference Digest. 12th IEEE International
Conference_Location :
Davos, Switzerland
Type :
conf
DOI :
10.1109/ISLC.1990.764458
Filename :
764458
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2798864
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