Title :
Efficient SAT-Based Search for Longest Sensitisable Paths
Author :
Sauer, Matthias ; Jiang, Jie ; Czutro, Alexander ; Polian, Ilia ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-Univ. Freiburg, Freiburg, Germany
Abstract :
We present a versatile method that enumerates all or a user-specified number of longest sensitisable paths in the whole circuit or through specific components. The path information can be used for design and test of circuits affected by statistical process variations. The algorithm encodes all aspects of the path search as an instance of the Boolean Satisfiability Problem (SAT), which allows the method not only to benefit from recent advances in SAT-solving technology, but also to avoid some of the drawbacks of previous structural approaches. Experimental results for academic and industrial benchmark circuits demonstrate the method´s accuracy and scalability.
Keywords :
Boolean functions; benchmark testing; circuit testing; computability; statistical analysis; Boolean satisfiability problem; SAT-based search; industrial benchmark circuit; longest sensitisable path; path information; statistical process variation; Accuracy; Delay; Encoding; Logic gates; Optimization; Upper bound; Wires; ATPG; KLPG; SAT; gate delay; longest path; path delay; process variation; sensitisable path;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.43