DocumentCode :
2799506
Title :
Bandwidth and gain enhanced pnp phototransistors for VIS and NIR light IN 180 nm CMOS
Author :
Kostov, Plamen ; Gaberl, Wolfgang ; Hofbauer, Michael ; Zimmermann, Horst
Author_Institution :
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
Volume :
2
fYear :
2012
fDate :
15-17 Oct. 2012
Firstpage :
475
Lastpage :
478
Abstract :
Two phototransistor concepts with a size of 40×40 μm2 are presented. These devices were implemented in a 180 nm standard CMOS process without process modifications. The use of a special starting material with a low doped p- epitaxial layer on top of the high doped p+ substrate opens the possibility for achieving high bandwidths and responsivities even for deep penetrating light. Optical characterization of the devices was done at 410 nm, 675 nm and 850 nm. Bandwidths up to 67 MHz and responsivities up to 12.35 A/W were achieved. These devices are well suited for integrated optoelectronic circuits (OEICs).
Keywords :
CMOS integrated circuits; integrated optoelectronics; phototransistors; semiconductor epitaxial layers; NIR light; OEIC; VIS light; bandwidth enhanced pnp phototransistors; deep penetrating light; gain enhanced PNP phototransistors; high doped p+ substrate; integrated optoelectronic circuits; low doped p- epitaxial layer; optical characterization; size 180 nm; standard CMOS process; wavelength 410 nm; wavelength 675 nm; wavelength 850 nm; Bandwidth; CMOS integrated circuits; CMOS technology; Photodiodes; Phototransistors; Silicon; Thyristors; BJT; CMOS Phototransistors; Light Detector; NIR; Silicon Photodetector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2012 International
Conference_Location :
Sinaia
ISSN :
1545-857X
Print_ISBN :
978-1-4673-0737-6
Type :
conf
DOI :
10.1109/SMICND.2012.6400726
Filename :
6400726
Link To Document :
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