• DocumentCode
    2799719
  • Title

    Double-gate SOI devices for low-power and high-performance applications

  • Author

    Roy, Kaushik ; Mahmoodi, Hamid ; Mukhopadhyay, Saibai ; Ananthan, Hari ; Bansal, Aditya ; Cakici, Tamer

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2005
  • fDate
    6-10 Nov. 2005
  • Firstpage
    217
  • Lastpage
    224
  • Abstract
    Double-gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG devices, quasi-planar SOI FinFETs are easier to manufacture compared to planar double-gate devices. DG devices with independent gates (separate contacts to back and front gates) have recently been developed. DG devices with symmetric and asymmetric gates have also been demonstrated. Such device options have direct implications at the circuit level. Independent control of front and back gate in DG devices can be effectively used to improve performance and reduce power in sub-50nm circuits. Independent gate control can be used to merge parallel transistors in noncritical paths. This results in reduction in the effective switching capacitance and hence power dissipation. We show a variety of circuits in logic and memory that can benefit from independent gate operation of DG devices. As examples, we show the benefit of independent gate operation in circuits such as dynamic logic circuits, Schmitt triggers, sense amplifiers, and SRAM cells. In addition to independent gate option, we also investigate the usefulness of asymmetric devices and the impact of width quantization and process variations on circuit design.
  • Keywords
    MOS integrated circuits; MOSFET; silicon-on-insulator; asymmetric gates; circuit design; double-gate SOI devices; double-gate devices; double-gate transistors; independent gate control; independent gate operation; nano-scale circuits; noncritical paths; parallel transistors; power dissipation; process variations; quasi-planar SOI FinFET; switching capacitance; symmetric gates; width quantization; Capacitance; FinFETs; Logic circuits; Logic devices; Manufacturing; Nanoscale devices; Operational amplifiers; Power dissipation; Scalability; Trigger circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
  • Print_ISBN
    0-7803-9254-X
  • Type

    conf

  • DOI
    10.1109/ICCAD.2005.1560067
  • Filename
    1560067