• DocumentCode
    2799870
  • Title

    Design of an expert system based on neural network ensembles for missile fault diagnosis

  • Author

    Xu, Dong ; Wu, Mei ; An, Jinwen

  • Author_Institution
    Dept. of Autom. Control, Northwestern Polytech. Univ., Xi´´an, China
  • Volume
    2
  • fYear
    2003
  • fDate
    8-13 Oct. 2003
  • Firstpage
    903
  • Abstract
    According to the specialty and complexity of the missile fault diagnosis, a novel expert system design method based on the neural network ensembles is proposed in this paper. With large amounts of typical missile fault samples and raw measurable parametric data available, the missile fault diagnosis system based on neural network ensembles can be created applying general construction techniques of the neural network fault diagnosis system, including signal preprocessing, fault feature extraction/selection, and network training. Combining the fault diagnosis system based on neural network ensembles, the framework of the missile fault diagnosis expert system is constructed with more flexibility and effectiveness in missile fault diagnosis. It´s proved that through diagnosis of the missile from several different sides by use of different parameters or combined parameters the designed system tends to give more reliable results.
  • Keywords
    control system analysis computing; diagnostic expert systems; fault diagnosis; feature extraction; learning (artificial intelligence); missile control; neural nets; signal processing; expert system design; fault feature extraction-selection; missile fault diagnosis; network training; neural network ensembles; neural network fault diagnosis system; signal preprocessing; Automatic control; Control systems; Diagnostic expert systems; Fault diagnosis; Feature extraction; Knowledge management; Management training; Missiles; Neural networks; Pattern recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics, Intelligent Systems and Signal Processing, 2003. Proceedings. 2003 IEEE International Conference on
  • Print_ISBN
    0-7803-7925-X
  • Type

    conf

  • DOI
    10.1109/RISSP.2003.1285707
  • Filename
    1285707