Distortion and noise performance of bottom-plate sampling mixers

Author

Yu, Wei ; Leung, Bosco

Author_Institution

Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada

Volume

4

fYear

1998

fDate

31 May-3 Jun 1998

Firstpage

401

Abstract

Distortion and noise in a bottom-plate sampling mixer are analyzed. The method of Volterra series is used to analyze distortion. The effects of continuous time, time varying, and sampling distortions are considered. Frequency domain method is used to analyze thermal noise. The method of stochastic differential equation is used to solve for LO noise. These two noise effects, when combined with LO jitter, give a complete noise picture. The analysis is performed in sampled data domain. Explicit formulas are given to guide the design of bottom-plate sampling mixers

Keywords

Volterra series; electric distortion; frequency-domain analysis; jitter; mixers (circuits); sampled data circuits; thermal noise; LO jitter; LO noise; Volterra series; bottom-plate sampling mixers; continuous time distortion; frequency domain method; sampled data domain; sampling distortion; stochastic differential equation; thermal noise; time varying distortion; Circuit noise; Circuit simulation; Differential equations; Local oscillators; MOS capacitors; Mixers; Radio frequency; Sampling methods; Stochastic resonance; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-4455-3

Type

conf

DOI

10.1109/ISCAS.1998.698883

Filename

698883