DocumentCode :
2800140
Title :
Modelling 2DEG charges in AlGaN/GaN heterostructures
Author :
Longobardi, Giorgia ; Udrea, F. ; Sque, Stephen ; Croon, Jeroen ; Hurkx, Fred ; Napoli, E. ; Sonsky, Jan
Author_Institution :
Dept. of Eng., Cambridge Univ., Cambridge, UK
Volume :
2
fYear :
2012
fDate :
15-17 Oct. 2012
Firstpage :
363
Lastpage :
366
Abstract :
In this paper we compare different approaches to calculating the charge density in the 2DEG layer of AlGaN/GaN HEMTs. The methods used are (i) analytical theory implemented in MATLAB, (ii) finite-element analysis using semiconductor TCAD software that implements only the Poisson and continuity equations, and (iii) 1D software that solves the Poisson and Schrödinger equations self-consistently. By using the 1D Poisson-Schrödinger solver, we highlight the consequences of neglecting the Schrödinger equation. We conclude that the TCAD simulator predicts with a reasonable level of accuracy the electron density in the 2DEG layer for both a conventional HEMT structure and one featuring an extra GaN cap layer. In addition, while the sheet charge density is not significantly affected by including Schrödinger, its confinement in the channel is found to be modified.
Keywords :
III-V semiconductors; Poisson equation; Schrodinger equation; aluminium compounds; electron density; electronic engineering computing; gallium compounds; high electron mobility transistors; semiconductor device models; semiconductor heterojunctions; technology CAD (electronics); two-dimensional electron gas; wide band gap semiconductors; 1D Poisson-Schrodinger solver; 1D software; 2DEG charges; 2DEG layer; AlGaN-GaN; AlGaN-GaN HEMT; AlGaN-GaN heterostructures; HEMT structure; MATLAB; Poisson equation; Schrodinger equation; TCAD simulator; analytical theory; continuity equation; electron density; extra GaN cap layer; finite-element analysis; semiconductor TCAD software; sheet charge density; Aluminum gallium nitride; Equations; Gallium nitride; HEMTs; MODFETs; Mathematical model; Piezoelectric polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2012 International
Conference_Location :
Sinaia
ISSN :
1545-857X
Print_ISBN :
978-1-4673-0737-6
Type :
conf
DOI :
10.1109/SMICND.2012.6400760
Filename :
6400760
Link To Document :
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