The evolution of built-in test for an electrical power generating system (EPGS)

Author

Dailey, Sandra J. ; Carpenter, William F.

Author_Institution

Sundstrand Adv. Technol. Group, Rockford, IL, USA

fYear

1989

fDate

22-26 May 1989

Firstpage

230

Abstract

The authors review the history of the EPGS built-in test (BIT), types of BIT, the lessons learned from EPGS BIT evolution, and BIT effectiveness. While earlier fault isolation capabilities relied on analog-based built-in-test (BIT) systems, current designs now use microprocessor-based BIT systems or a combination of the two. It is noted that locations of readouts and types of codes/information play an important part in BIT utilization

Keywords

automatic test equipment; automatic testing; fault location; microcomputer applications; power system measurement; ATE; built-in test; effectiveness; electrical power generating system; fault isolation capabilities; fault location; microprocessor application; Built-in self-test; Displays; Logic; Maintenance; Microprocessors; Military aircraft; Nonvolatile memory; Personnel; Power generation; Protection;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National

Conference_Location

Dayton, OH

Type

conf

DOI

10.1109/NAECON.1989.40218

Filename

40218

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2800142