DocumentCode :
2800204
Title :
Static and transient analysis of a 4H-SiC trench Bipolar Mode FET with normally-off characteristics
Author :
Pezzimenti, F. ; Della Corte, Francesco G.
Author_Institution :
Univ. degli Studi Mediterranea di Reggio Calabria-DIMET, Reggio Calabria, Italy
Volume :
2
fYear :
2012
fDate :
15-17 Oct. 2012
Firstpage :
347
Lastpage :
350
Abstract :
Steady-state and switching characteristics of a normally-off 4H-SiC Bipolar Mode FET (BMFET) are investigated in a wide range of temperatures by means of an intensive simulation analysis useful for a first time ever realization of this device in SiC. An output drain current density up to 500 A/cm2, an high current gain and an on-resistance as low as 2 mΩ·cm2, are calculated when the gate regions are forward biased. The turn-off delay is in the order of 5 ns and the blocking voltage is higher than 1.2 kV. This study is supported by experimental data on the gate-drain and gate-source p-i-n diodes embedded in the BMFET structure.
Keywords :
bipolar transistors; current density; field effect transistors; p-i-n diodes; silicon compounds; BMFET structure; SiC; blocking voltage; current gain; gate region; gate-drain p-i-n diodes; gate-source p-i-n diodes; intensive simulation analysis; normally-off bipolar mode FET; normally-off characteristics; output drain current density; static analysis; steady-state characteristics; switching characteristics; temperature; time 5 ns; transient analysis; trench bipolar mode FET; turn-off delay; Charge carrier lifetime; Current density; Doping; Logic gates; Plasma temperature; Silicon carbide; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2012 International
Conference_Location :
Sinaia
ISSN :
1545-857X
Print_ISBN :
978-1-4673-0737-6
Type :
conf
DOI :
10.1109/SMICND.2012.6400764
Filename :
6400764
Link To Document :
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