• DocumentCode
    2800338
  • Title

    A non-parabolic six moments model for the simulation of sub-100 nm devices

  • Author

    Grasser, T. ; Kosik, R. ; Jungemann, Christoph ; Kosina, H. ; Meinerzhagen, B. ; Selberherr, Siegfried

  • Author_Institution
    Christian Doppler Lab. for TCAD in Microelectron., Inst. for Microelectron., Vienna, Austria
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    36
  • Lastpage
    37
  • Abstract
    Macroscopic transport models based on the first six moments of Boltzmann\´s equation (Grasser et al., 2001) are a natural extension to the well known drift-diffusion (DD) model (two moments) and the various hydrodynamic and energy-transport models (three or four moments) (Grasser et al., 2003). In addition to the solution variables of the energy-transport (ET) model, which are the carrier concentration n = <1> and the average energy w/sub 1/ = , the six moments (SM) model provides w/sub 2/ = . The quantity /spl beta/ = (3/5)w/sub 2//w/sub 1//sup 2/ is the kurtosis of the distribution function and indicates the deviation from a heated Maxwellian distribution for which /spl beta/ = 1 holds (for parabolic bands). Here we present results of numerical solutions of consistent DD, ET, and SM models and compare them to self-consistent analytic-band (Jacoboni and Lugli, 1989) and full-band (Jungemann and Meinerzhagen, 2003) Monte Carlo (MC) simulation results.
  • Keywords
    Boltzmann equation; Monte Carlo methods; carrier density; method of moments; semiconductor device models; 100 nm; Boltzmann equation; Monte Carlo simulation; carrier concentration; drift-diffusion model; energy-transport model; nonparabolic six moments model; self-consistent analytic-band simulation; self-consistent full-band simulation; Boltzmann equation; Charge carrier density; Moment methods; Monte Carlo methods; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
  • Conference_Location
    West Lafayette, IN, USA
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/IWCE.2004.1407308
  • Filename
    1407308