DocumentCode :
2800411
Title :
Microsystems for UV-visible and x-ray analysis of protein crystals
Author :
Cheung, L.S.L. ; Quick, R. ; Singh, S.K. ; Weichsel, A. ; Montfort, W.R. ; Zohar, Y.
Author_Institution :
Univ. of Arizona, Tucson
fYear :
2007
fDate :
21-25 Jan. 2007
Firstpage :
569
Lastpage :
572
Abstract :
polydimethylsiloxane (PDMS) based microsystems have successfully been fabricated and characterized for studying protein crystals utilizing both UV-visible spectroscopy and X-ray crystallography. Transmittance tests have been conducted with PDMS and glass substrates; the measurements indicate that in PDMS, unlike glass, the emerging intensity is higher than 50% of the incident intensity as long as the total optical path is shorter than 100 mum. Indeed, both the UV-visible spectrum and X-ray diffraction of a protein crystal enclosed in a PDMS device are almost identical to those of the crystal alone. Hence, PDMS is suitable as substrate material in device fabrication to study protein crystals. In glass, however, the UV-visible spectrum is significantly distorted and the X-ray diffraction pattern is rather weak resulting in poor signal to noise ratio. Furthermore, microsystems integrated with micro- channels allowing continuous exchange of buffer solution around the protein crystals have been tested; this would greatly enhance the potential to induce, trap and characterize functional states in proteins.
Keywords :
X-ray analysis; X-ray crystallography; X-ray diffraction; proteins; PDMS device; UV-visible analysis; UV-visible spectroscopy; UV-visible spectrum; X-ray analysis; X-ray crystallography; X-ray diffraction pattern; buffer solution; device fabrication; glass substrates; polydimethylsiloxane based microsystems; protein crystals; substrate material; transmittance tests; Crystallography; Crystals; Glass; Optical buffering; Optical diffraction; Optical distortion; Proteins; Spectroscopy; Testing; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2007. MEMS. IEEE 20th International Conference on
Conference_Location :
Hyogo
ISSN :
1084-6999
Print_ISBN :
978-1-4244-095-5
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2007.4433161
Filename :
4433161
Link To Document :
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