DocumentCode :
2800527
Title :
Discriminative template extraction for direct modeling
Author :
Shivappa, Shankar ; Nguyen, Patrick ; Zweig, Geoffrey
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
fYear :
2010
fDate :
14-19 March 2010
Firstpage :
4338
Lastpage :
4341
Abstract :
This paper addresses the problem of developing appropriate features for use in direct modeling approaches to speech recognition, such as those based on Maximum Entropy models or Segmental Conditional Random Fields. We propose a feature based on the detection of word-level templates which are discriminatively chosen based on a mutual information criterion. The templates for a word are derived directly from the MFCC feature vectors, based on self-similarity across examples. No pronunciation dictionary is used, and the resulting templates match closely to in-class examples and distantly to out-of-class examples. We utilize template detection events as input to a segmental CRF speech recognizer. We evaluate the entire scheme on a voice search task. The results show that the use of discriminative template based word detector streams improves the speech recognizer´s performance over the baseline HMM results.
Keywords :
cepstral analysis; feature extraction; hidden Markov models; maximum entropy methods; random processes; speech recognition; HMM; MFCC feature vectors; Mel frequency cepstral coefficients; direct modeling approaches; discriminative template extraction; feature detection; maximum entropy models; segmental CRF speech recognizer; segmental conditional random fields; speech recognition; voice search task; word-level templates; Data mining; Decoding; Detectors; Dictionaries; Entropy; Event detection; Hidden Markov models; Mel frequency cepstral coefficient; Mutual information; Speech recognition; Discriminative Templates; Segmental Conditional Random Fields; Speech Recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
Conference_Location :
Dallas, TX
ISSN :
1520-6149
Print_ISBN :
978-1-4244-4295-9
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2010.5495647
Filename :
5495647
Link To Document :
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