Title :
Phonon-limited transport in carbon nanotubes using the Monte Carlo method
Author :
Pennington, G. ; Akturk, A. ; Goldsman, N.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Abstract :
Carbon nanotubes (CNTs) are at the forefront of current research in nanoelectronics. At the present many questions still exist regarding the transport properties of these materials. The mobility of long (/spl sim/325 /spl mu/m) single-walled carbon nanotubes (SWCNTs) agrees very well with semiclassical transport simulations involving inelastic phonon scattering. Such a transport model is likely to be valid when the tube length is longer than the momentum relaxation length (L/sub m/), but may give insights into the electronic and phonon properties of nanotubes of all lengths. One may investigate the dependence of L/sub m/, or other important transport properties such as the phonon-limited mobility, on the tube diameter, on surrounding fields, and on the temperature. Monte Carlo simulations require models for the electron and phonon energy as a function of wavevector. The wavevector space of a nanotube is discretized into a large number of 1-D zones, each corresponding to a single electron subband or a single phonon subbranch.
Keywords :
Monte Carlo methods; carbon nanotubes; electron mobility; electron-phonon interactions; nanoelectronics; semiconductor device models; Monte Carlo method; electron energy; electronic properties; inelastic phonon scattering; momentum relaxation length; nanoelectronics; phonon energy; phonon properties; phonon-limited mobility; phonon-limited transport; semiclassical transport simulations; single electron subband; single phonon subbranch; single-walled carbon nanotubes; surrounding fields; transport model; transport properties; tube diameter; wavevector space; Charge carrier mobility; Electrons; Monte Carlo methods; Phonons; Semiconductor device modeling;
Conference_Titel :
Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
Conference_Location :
West Lafayette, IN, USA
Print_ISBN :
0-7803-8649-3
DOI :
10.1109/IWCE.2004.1407316