• DocumentCode
    2800763
  • Title

    Batch fabrication of carbon nanotubes on tips of a silicon pyramid array

  • Author

    Takagahara, Kazuhiko ; Takei, Yusuke ; Matsumoto, Kiyoshi ; Shimoyama, Isao

  • Author_Institution
    Univ. of Tokyo, Tokyo
  • fYear
    2007
  • fDate
    21-25 Jan. 2007
  • Firstpage
    855
  • Lastpage
    858
  • Abstract
    We have proposed batch fabrication of silicon pyramids with upward CNTs on the tips at one time by a chemical vapor deposition (CVD) process. To synthesize upward CNTs on the pyramid tips, an upward electric field was applied to the silicon pyramid array during the CVD process. By electric field simulation and verifying experiment on silicon one-dimensional array structures, we found that CNTs tended to grow from sharp tips in our method. We fabricated the silicon pyramid array with sharp tips by anisotropic wet etching. After the CVD process, CNTs growing from the tips of the pyramids were observed by a scanning electron microscope (SEM). As a result, about 70% of 100 times 100 silicon pyramid array had CNTs on the tips. Our method would be valuable for fabricating probes of atomic force microscope (AFM) with CNTs on the tips (CNT-AFM probes).
  • Keywords
    arrays; atomic force microscopy; batch processing (industrial); carbon nanotubes; chemical vapour deposition; elemental semiconductors; etching; nanotechnology; scanning electron microscopy; semiconductor nanotubes; silicon; AFM; CVD process; SEM; Si; anisotropic wet etching; atomic force microscope; batch fabrication; carbon nanotubes; chemical vapor deposition; electric field simulation; one-dimensional silicon array structures; scanning electron microscope; silicon pyramid array; Atmosphere; Atomic force microscopy; Carbon nanotubes; Counting circuits; Electrodes; Fabrication; Information science; Probes; Scanning electron microscopy; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2007. MEMS. IEEE 20th International Conference on
  • Conference_Location
    Hyogo
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-095-5
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2007.4433180
  • Filename
    4433180