Title :
Statistical timing analysis driven post-silicon-tunable clock-tree synthesis
Author :
Tsai, Jeng-Liang ; Zhang, Lizheng ; Chen, Charlie Chung-Ping
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock tuning. Existing design approaches for post-silicon-tunable (PST) clock-tree synthesis usually insert a PST clock buffer for each flip-flop or put PST clock buffers across an entire level of a clock-tree. This can cause significant over-design and long tuning time. In this paper, we propose to insert PST clock buffers at both internal and leaf nodes of a clock-tree and use a bottom-up algorithm to reduce the number of candidate PST clock buffer locations. We then provide two statistical-timing-driven optimization algorithms to reduce the hardware cost of a PST clock-tree. Experimental results on ISCAS89 benchmark circuits show that our algorithms achieve up to a 90% area or a 90% number of tunable clock buffer reductions compared to existing design methods.
Keywords :
buffer circuits; circuit tuning; clocks; flip-flops; logic design; trees (electrical); PST clock buffer; deep sub-micron technologies; flip-flop; post-silicon-tunable clock-tree synthesis; statistical timing analysis; statistical-timing-driven optimization; timing uncertainty; tunable clock buffer reduction; yield degradation; Clocks; Cost function; Counting circuits; Degradation; Design methodology; Flip-flops; Hardware; Timing; Tunable circuits and devices; Uncertainty;
Conference_Titel :
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Print_ISBN :
0-7803-9254-X
DOI :
10.1109/ICCAD.2005.1560132