DocumentCode :
2800886
Title :
Verification of Complex Analog Integrated Circuits
Author :
Kundert, Ken ; Chang, Henry
fYear :
2007
fDate :
15-16 Nov. 2007
Firstpage :
1
Lastpage :
8
Keywords :
Adaptive filters; Analog integrated circuits; Automatic testing; Calibration; Circuit testing; Digital control; Error correction; Signal design; System testing; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System-on-Chip, 2007. DCAS 2007. 6th IEEE Dallas Circuits and Systems Workshop on
Conference_Location :
Dallas, TX, USA
Print_ISBN :
978-1-4244-1680-6
Electronic_ISBN :
978-1-4244-1680-6
Type :
conf
DOI :
10.1109/DCAS.2007.4433194
Filename :
4433194
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2800886
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