DocumentCode
2800899
Title
Arbitrary crystallographic orientation in QDAME with Ge 7.5 nm DGFET examples
Author
Laux, S.E.
Author_Institution
Semicond. R&D Center, IBM Res. Div., Yorktown Heights, NY, USA
fYear
2004
fDate
24-27 Oct. 2004
Firstpage
76
Lastpage
77
Abstract
QDAME (quantum device analysis by modal evaluation) has been extended to permit device simulations with arbitrary orientation between real-space and k-space coordinate systems. The work resembles in scope the extension of NanoMOS by Rahman, et al. to permit arbitrary crystallographic orientation and its subsequent invocation by Low, et al. in the context of Ge DGFETs. This work is differentiated from theirs as follows: (i) the two-dimensional Schrodinger equation with appropriately modified traveling wave boundary conditions was solved; no assumptions are invoked concerning the device geometry or the lumping of transport along a centerline of symmetry from source to drain, (ii) ´unusual´ crystallographic directions to highlight our simulation capability and to demonstrate that current does not necessarily flow down the center of a symmetric Ge DGFET device structure were considered.
Keywords
MOSFET; Schrodinger equation; germanium; quantum interference devices; semiconductor device models; 7.5 nm; Ge; Ge DGFET; NanoMOS; Schrodinger equation; boundary conditions; crystallographic orientation; device geometry; device simulations; k-space coordinate systems; modal evaluation; quantum device analysis; real-space coordinate systems; transport lumping; Germanium; MOSFETs; Partial differential equations; Quantum effect semiconductor devices; Quantum theory; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
Conference_Location
West Lafayette, IN, USA
Print_ISBN
0-7803-8649-3
Type
conf
DOI
10.1109/IWCE.2004.1407331
Filename
1407331
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