DocumentCode :
2800899
Title :
Arbitrary crystallographic orientation in QDAME with Ge 7.5 nm DGFET examples
Author :
Laux, S.E.
Author_Institution :
Semicond. R&D Center, IBM Res. Div., Yorktown Heights, NY, USA
fYear :
2004
fDate :
24-27 Oct. 2004
Firstpage :
76
Lastpage :
77
Abstract :
QDAME (quantum device analysis by modal evaluation) has been extended to permit device simulations with arbitrary orientation between real-space and k-space coordinate systems. The work resembles in scope the extension of NanoMOS by Rahman, et al. to permit arbitrary crystallographic orientation and its subsequent invocation by Low, et al. in the context of Ge DGFETs. This work is differentiated from theirs as follows: (i) the two-dimensional Schrodinger equation with appropriately modified traveling wave boundary conditions was solved; no assumptions are invoked concerning the device geometry or the lumping of transport along a centerline of symmetry from source to drain, (ii) ´unusual´ crystallographic directions to highlight our simulation capability and to demonstrate that current does not necessarily flow down the center of a symmetric Ge DGFET device structure were considered.
Keywords :
MOSFET; Schrodinger equation; germanium; quantum interference devices; semiconductor device models; 7.5 nm; Ge; Ge DGFET; NanoMOS; Schrodinger equation; boundary conditions; crystallographic orientation; device geometry; device simulations; k-space coordinate systems; modal evaluation; quantum device analysis; real-space coordinate systems; transport lumping; Germanium; MOSFETs; Partial differential equations; Quantum effect semiconductor devices; Quantum theory; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
Conference_Location :
West Lafayette, IN, USA
Print_ISBN :
0-7803-8649-3
Type :
conf
DOI :
10.1109/IWCE.2004.1407331
Filename :
1407331
Link To Document :
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