DocumentCode :
2800966
Title :
Aspect-model-based reference speaker weighting
Author :
Hahm, Seongjun ; Ohkawa, Yuichi ; Ito, Masashi ; Suzuki, Motoyuki ; Ito, Akinori ; Makino, Shozo
Author_Institution :
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear :
2010
fDate :
14-19 March 2010
Firstpage :
4302
Lastpage :
4305
Abstract :
We propose an aspect-model-based reference speaker weighting. The main idea of the approach is that the adapted model is a linear combination of a set of reference speakers like reference speaker weighting (RSW) and eigenvoices. The aspect model is the mixture model of speaker-dependent (SD) models. In this paper, aspect model weighting (AMW) is proposed for finding an optimal weighting of a set of reference speakers unlike RSW and the aspect model which is a kind of cluster models is trained based on likelihood maximization with respect to the training data. The number of adaptation parameters can also be reduced using aspect model approach. For evaluation, we carried out an isolated word recognition experiment on Korean database (KLE452). The results were compared to those of conventional MAP, MLLR, RSW, and eigenvoice. Even though we use only 0.5s of adaptation data, 27.24% relative error rate reduction in comparison with speaker-independent (SI) baseline performance was achieved.
Keywords :
eigenvalues and eigenfunctions; maximum likelihood estimation; pattern clustering; speaker recognition; text analysis; Korean database; aspect-model-based reference speaker weighting; cluster models; eigenvoice; likelihood maximization; reference speaker set; speaker-dependent model; speech recognition; word recognition; Bayesian methods; Databases; Educational technology; Error analysis; Hidden Markov models; Informatics; Maximum likelihood linear regression; Speech recognition; Training data; Vectors; Aspect Model Weighting; Reference Speaker Weighting; Speaker Adaptation; Speech Recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
Conference_Location :
Dallas, TX
ISSN :
1520-6149
Print_ISBN :
978-1-4244-4295-9
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2010.5495672
Filename :
5495672
Link To Document :
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