• DocumentCode
    2800983
  • Title

    Treatment of point defects in nanowire MOSFETs using the nonequilibrium Green´s function formalism

  • Author

    Bescond, M. ; Autran, J.-L. ; Cavassilas, N. ; Munteanu, D. ; Lannoo, M.

  • Author_Institution
    Provence Mater. & Microelectron. Lab., UMR CNRS, Marseille, France
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    84
  • Lastpage
    85
  • Abstract
    This paper describes the point defect treatment in nanowire MOSFETs. The 3D Poisson equation is self-consistently coupled to the Schrodinger equation. We adopt the mode-space representation in which the 3D Schrodinger equation is divided into a 2D equation, including the confinement of the cross-section, and an ID equation describing the ballistic transport based on the nonequilibrium Green´s function formalism (NEGF). We use the simplest form of the tight-binding theory, with one orbital per atom, and considering only the first-neighbor-interactions. In this framework, equivalent to the ellipsoidal energy band approximation, influence of point defects on electronic transport is discussed.
  • Keywords
    Green´s function methods; MOSFET; Poisson equation; Schrodinger equation; ballistic transport; nanowires; point defects; 3D Poisson equation; Schrodinger equation; ballistic transport; electronic transport; ellipsoidal energy band approximation; first-neighbor-interactions; mode-space representation; nanowire MOSFET; nonequilibrium Green´s function formalism; point defect treatment; tight-binding theory; Green function; MOSFETs; Partial differential equations; Quantum theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
  • Conference_Location
    West Lafayette, IN, USA
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/IWCE.2004.1407335
  • Filename
    1407335