DocumentCode :
2800983
Title :
Treatment of point defects in nanowire MOSFETs using the nonequilibrium Green´s function formalism
Author :
Bescond, M. ; Autran, J.-L. ; Cavassilas, N. ; Munteanu, D. ; Lannoo, M.
Author_Institution :
Provence Mater. & Microelectron. Lab., UMR CNRS, Marseille, France
fYear :
2004
fDate :
24-27 Oct. 2004
Firstpage :
84
Lastpage :
85
Abstract :
This paper describes the point defect treatment in nanowire MOSFETs. The 3D Poisson equation is self-consistently coupled to the Schrodinger equation. We adopt the mode-space representation in which the 3D Schrodinger equation is divided into a 2D equation, including the confinement of the cross-section, and an ID equation describing the ballistic transport based on the nonequilibrium Green´s function formalism (NEGF). We use the simplest form of the tight-binding theory, with one orbital per atom, and considering only the first-neighbor-interactions. In this framework, equivalent to the ellipsoidal energy band approximation, influence of point defects on electronic transport is discussed.
Keywords :
Green´s function methods; MOSFET; Poisson equation; Schrodinger equation; ballistic transport; nanowires; point defects; 3D Poisson equation; Schrodinger equation; ballistic transport; electronic transport; ellipsoidal energy band approximation; first-neighbor-interactions; mode-space representation; nanowire MOSFET; nonequilibrium Green´s function formalism; point defect treatment; tight-binding theory; Green function; MOSFETs; Partial differential equations; Quantum theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
Conference_Location :
West Lafayette, IN, USA
Print_ISBN :
0-7803-8649-3
Type :
conf
DOI :
10.1109/IWCE.2004.1407335
Filename :
1407335
Link To Document :
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