Title :
FastSies: a fast stochastic integral equation solver for modeling the rough surface effect
Author :
Zhu, Zhenhai ; White, Jacob
Author_Institution :
Cadence Berkeley Labs, CA, USA
Abstract :
In this paper we describe several novel sparsification techniques used in a fast stochastic integral equation solver to compute the mean value and the variance of capacitance of 3D interconnects with random surface roughness. With the combination of these numerical techniques, the computational cost has been reduced from O(N4) to O(Nlog2(N)), where N is the number of panels used for the discretization of nominal smooth surfaces. Numerical experiments show that the proposed numerical techniques are accurate and efficient.
Keywords :
integral equations; integrated circuit interconnections; rough surfaces; stochastic processes; surface roughness; 3D interconnects; fast stochastic integral equation solver; random surface roughness; rough surface effect; sparsification techniques; Capacitance; Computational efficiency; Conductors; Electrical resistance measurement; Integral equations; Monte Carlo methods; Rough surfaces; Stochastic processes; Surface resistance; Surface roughness;
Conference_Titel :
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Print_ISBN :
0-7803-9254-X
DOI :
10.1109/ICCAD.2005.1560152