Title :
Evaluation of large area die attach using acoustic microscopy
Author_Institution :
Plessey Res. Caswell Ltd., Towcester, UK
Abstract :
The technique chosen at Caswell for the analysis of die-bonds is acoustic microscopy. This is a reflection rather than transmission based technique, and has been used successfully for the nondestructive analysis of die-bonds up to 15 mm square. In this presentation, comparisons will be made between acoustic microscopy and other die-attach evaluation techniques. Examples will be shown of the way in which acoustic microscopy is used for bond evaluation and other assembly related activities
Keywords :
acoustic microscopy; integrated circuit testing; nondestructive testing; Caswell; acoustic microscopy; assembly related activities; bond evaluation; die-bonds; large area die attach; nondestructive analysis; reflection-based technique;
Conference_Titel :
NDT Evaluation of Electronic Components and Assemblies, IEE Colloquium on
Conference_Location :
London