Title :
IEE Colloquium on `NDT Evaluation of Electronic Components and Assemblies´ (Digest No.094)
Abstract :
The following topics were dealt with: inspection; acoustic microscopy; ESD; SMT; logic testing
Keywords :
acoustic microscopy; electronic equipment testing; inspection; integrated circuit testing; printed circuit testing; ESD; SMT; acoustic microscopy; inspection; logic testing;
Conference_Titel :
NDT Evaluation of Electronic Components and Assemblies, IEE Colloquium on
Conference_Location :
London
