Title :
Mechanisms for total dose sensitivity to preirradiation thermal stress in bipolar linear microcircuits
Author :
Pease, Ronald L. ; Shaneyfelt, Marty ; Winokur, Peter ; Fleetwood, Dan ; Gorelick, Jerry ; McClure, Steve ; Clark, Steve ; Cohn, Lew ; Alexander, Dave
Author_Institution :
RLP Res., Albuquerque, NM, USA
Abstract :
The ionizing radiation response of several semiconductor process technologies has been shown to be affected by preirradiation thermal stress. Data on bipolar linear circuits are presented and discussed in terms of the mechanisms previously proposed for CMOS
Keywords :
bipolar analogue integrated circuits; gamma-ray effects; thermal stresses; bipolar linear microcircuit; ionizing radiation response; preirradiation thermal stress; semiconductor process technology; total dose sensitivity; CMOS technology; Ceramics; Laboratories; MOSFETs; Plastic packaging; Radiation hardening; Space technology; Temperature; Thermal stresses; Weapons;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698890
